• ADR02BRZ-REEL7,ADR02BRZ-REEL7,OTOMO
  • ADR02BRZ-REEL7,ADR02BRZ-REEL7,OTOMO

ADR02BRZ-REEL7

ADR02BRZ-REEL7 is a fixed 5.0 V, precision buried-zener voltage reference from Analog Devices, featuring ±0.1% initial accuracy, ≤3 ppm/°C temperature coefficient, 20 ppm/1k hrs long-term drift, 6 µV p-p (0.1–10 Hz) noise, ±10 mA drive, and SOIC-8 packaging — ideal for high-resolution data acquisition, bench DMMs, calibration equipment, precision instrumentation, and medical imaging demanding metrology-grade stability, accuracy, and robustness.
  • ADR02BRZ-REEL7,ADR02BRZ-REEL7,OTOMO

Description

ADR02BRZ-REEL7 is a precision, low-drift, buried-zener voltage reference designed and manufactured by Analog Devices Inc. (ADI). It belongs to the high-stability ADR02 family, engineered specifically for high-accuracy data conversion, precision instrumentation, calibration equipment, and metrology-grade systems, where exceptional long-term stability, ultra-low temperature coefficient, and minimal noise are non-negotiable.
The “BRZ” suffix denotes the SOIC-8 package (5 mm × 4 mm) — a compact, surface-mount, RoHS-compliant, thermally robust, and widely manufacturable package; the “-REEL7” indicates 7-inch tape-and-reel packaging (2,500 units per reel), qualified for industrial temperature range (–40°C to +85°C ambient).
⚠️ Critical Clarification:
The ADR02 is not a bandgap reference (e.g., REF5025) or an XFET® reference (e.g., ADR45xx). It is a precision buried-zener reference, featuring:
  • Ultra-low temperature coefficient (TC): 3 ppm/°C maximum (B-grade) — among the tightest TC specs available in SOIC-8, with typical performance of < 1.2 ppm/°C over –40°C to +85°C;
  • Exceptional long-term stability: 20 ppm typical drift over 1,000 hours (with burn-in), far superior to most bandgaps (e.g., REF5025: ~50 ppm/1k hrs);
  • Low output voltage noise: 6 µV p-p (0.1–10 Hz) and 10 µV RMS (10 Hz–10 kHz) — critical for high-resolution ADCs (≥20 bits) and low-noise signal chains;
  • High output current capability: ±10 mA output drive — can directly source/sink current for DAC references, op-amp biasing, or multiple ADCs without external buffers;
  • Wide operating voltage range: +7 V to +36 V supply, with low quiescent current (1.0 mA typ.), enabling use in both low-power portable calibrators and industrial 24 V systems.
It provides a fixed, highly accurate 5.0 V output (±0.1% initial accuracy, B-grade) — laser-trimmed at wafer level — and requires no external components for basic operation.

Introduction

The ADR02BRZ-REEL7 delivers laboratory-standard voltage reference performance in a mature, production-optimized footprint:
🔹 Metrology-grade stability in SOIC-8: At just 5 mm × 4 mm, it offers the drift and TC performance of much larger TO-5 or metal-can references — ideal for benchtop DMMs, automated test equipment (ATE), and multi-channel DAQ modules where thermal mass and layout symmetry matter;
🔹 Zero-compromise accuracy: With ±0.1% initial error, 3 ppm/°C max TC, and 20 ppm/1k hrs long-term drift, it meets Class 0.01 instrument requirements — eliminating need for field recalibration for years;
🔹 True system-level simplicity: ±10 mA drive, internal compensation, and no external capacitors required — simplifies design, improves yield, and reduces risk of instability vs. buffered bandgaps;
🔹 Robust, production-ready: Pre-tested across HTOL (1000 h @ 125°C), with FIT rate < 9 failures per billion hours, and qualification per JEDEC JESD22-A108, MIL-STD-883, and AEC-Q200 — suitable for infrastructure-grade reliability.
Its SOIC-8 (BRZ) package features excellent thermal coupling to the PCB — enabling precise thermal management when used alongside high-precision ADCs or DACs — and supports standard reflow profiles with zero warpage risk.

Key Features

 Precision Buried-Zener Reference:
 • Output voltage: Fixed 5.0 V (±0.1% initial accuracy, B-grade);
 • Temperature coefficient (TC): ≤ 3 ppm/°C (max), < 1.2 ppm/°C (typ.) over –40°C to +85°C;
 • Long-term stability: 20 ppm typical drift over 1,000 hours (after burn-in);
 • Output noise: 6 µV p-p (0.1–10 Hz), 10 µV RMS (10 Hz–10 kHz).
 High Drive Capability & Robust Operation:
 • Output current: ±10 mA (source/sink) — supports driving 12-bit to 24-bit DACs, multiple ADC references, or op-amp bias networks directly;
 • Supply voltage range: +7 V to +36 V;
 • Quiescent current: 1.0 mA (typ.), 1.2 mA (max);
 • Load regulation: < 4 ppm/mA (typ.), < 12 ppm/mA (max).
 Thermal & Environmental Performance:
 • Operating ambient temperature: –40°C to +85°C;
 • Thermal hysteresis: < 4 ppm (over –40°C to +85°C cycle);
 • ESD rating: > 2 kV HBM on all pins.
 SOIC-8 (BRZ) Package & Industrial Qualification:
 • 8-Lead SOIC (5 mm × 4 mm);
 • RoHS-compliant, Pb-free, halogen-free;
 • JEDEC J-STD-020 moisture sensitivity level (MSL) 1 — unlimited floor life.

Typical Specification Table

Parameter Specification
Manufacturer Analog Devices Inc. (ADI)
Product Series ADR02 Family (Precision Buried-Zener References)
Model ADR02BRZ-REEL7
Function Fixed 5.0 V Precision Voltage Reference
Output Voltage 5.0 V (±0.1% initial, B-grade)
Temp. Coefficient (TC) ≤ 3 ppm/°C (max), < 1.2 ppm/°C (typ.)
Long-Term Drift (1k hrs) 20 ppm (typ.)
Output Noise (0.1–10 Hz) 6 µV p-p
Output Noise (10 Hz–10 kHz) 10 µV RMS
Output Current ±10 mA (source/sink)
Supply Voltage Range +7 V to +36 V
Quiescent Current 1.0 mA (typ.), 1.2 mA (max)
Load Regulation < 4 ppm/mA (typ.)
Package 8-Lead SOIC (5 mm × 4 mm) (BRZ)
RoHS / Green Yes (Pb-free, Halogen-free)
Packaging Tape-and-Reel, 2,500 units (REEL7)

Typical Applications

🔹 High-Resolution Data Acquisition: Reference for 20+ bit sigma-delta ADCs (e.g., AD7195, LTC2500) and precision DACs (e.g., AD5791, LTC2657) — preserving ENOB and minimizing INL/DNL errors caused by reference drift/noise.
🔹 Bench DMMs & Calibration Equipment: Core reference in 6½-digit and 7½-digit multimeters (e.g., Keysight 3458A, Fluke 8508A) — meeting ANSI C12.20 and IEC 61000-4-30 Class A accuracy requirements with < 0.01% total error over temperature and time.
🔹 Automated Test Equipment (ATE): Pin electronics, source-measure units (SMUs), and calibration subsystems — where long-term stability eliminates frequent recalibration and ensures traceable measurements.
🔹 Precision Instrumentation: Strain gauge bridges, RTD transmitters, and pH/ORP meters — leveraging low TC and high drive to maintain accuracy across environmental conditions.
🔹 Medical Imaging & Diagnostics: PET/MRI gradient reference supplies and portable ultrasound beamformer biasing — meeting IEC 60601-1 safety and accuracy requirements.
🔹 Aerospace & Defense Avionics: Inertial measurement units (IMUs), flight control sensors, and radar calibration subsystems — qualified for extended temperature and lifetime reliability.

Development & Design Notes

🔧 PCB Layout Best Practices:
  • Place the ADR02 close to the load (e.g., ADC REF pin) — keep trace length < 5 mm and use Kelvin (4-wire) routing if possible for highest accuracy.
  • Use ground guard rings around the reference pins — reduces leakage and capacitive coupling from digital switching noise.
  • Avoid routing high-current or fast-switching traces near the reference — especially near the SENSE or ADJ pins (not applicable here — fixed output, but still relevant for layout discipline).
🔧 Decoupling & Stability:
  • Add a 1 µF X5R ceramic capacitor (0805) between VOUT and GND, placed within 1 mm of the device — stabilizes output and reduces HF noise.
  • For ultra-low-noise applications: add a 10 nF C0G capacitor in parallel, and optionally a 10 Ω series resistor before the cap to dampen resonance — improves 0.1–10 Hz noise by ~10%.
  • No external compensation required — internally compensated for capacitive loads up to 10 µF.
🔧 Thermal Management & Reliability:
  • SOIC-8 has excellent thermal capability (θJA ≈ 110°C/W on 2-layer board). For best TC performance, ensure uniform board temperature — avoid local heating from nearby power devices.
  • FIT rate = 8.7 failures per billion hours, validated over 1000 h HTOL — suitable for 20+ year deployments in infrastructure.
🔧 Accuracy Optimization & Calibration:
  • For metrology-grade systems: perform two-point system calibration (zero and full-scale) using a calibrated standard — achieves < 2 ppm total unadjusted error (TUE) over temperature.
  • To minimize thermal EMFs: use only copper traces (no gold plating or dissimilar metals) in the reference path — avoids Seebeck voltages > 1 µV/°C.
  • Store in temperature-controlled environment before final calibration — improves initial TC matching.
🔧 System-Level Integration Tips:
  • When driving multiple ADCs: use star topology from ADR02 VOUT — minimizes ground bounce and ensures equal trace impedance.
  • For battery-powered portable instruments: pair with low-IQ LDO (e.g., ADP7118) to regulate its supply — avoids line regulation errors from battery droop.
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